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1

Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing

Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita

Journal:

Journal of Electronic Testing

Year:

2008

Language:

english

File:

PDF, 339 KB

english, 2008

2

Retention-Aware Refresh Techniques for Reducing Power and Mitigation of Data Retention Faults in DRAM

Lu, Shyue-Kung, Huang, Hung-Kai, Hsu, Chun-Lung, Sun, Chi-Tien, Miyase, Kohei

Journal:

Journal of Electronic Testing

Year:

2019

Language:

english

File:

PDF, 792 KB

english, 2019

3

Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments

Yan, Aibin, Feng, Xiangfeng, Hu, Yuanjie, Lai, Chaoping, Cui, Jie, Chen, Zhili, Miyase, Kohei, Wen, Xiaoqing

Journal:

IEEE Transactions on Aerospace and Electronic Systems

Year:

2019

Language:

english

File:

PDF, 1.53 MB

english, 2019

4

[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - Low Power BIST for Scan-Shift and Capture Power

Sato, Yasuo, Wang, Senling, Kato, Takaaki, Miyase, Kohei, Kajihara, Seiji

Year:

2012

Language:

english

File:

PDF, 238 KB

english, 2012

5

[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - A Scan-Out Power Reduction Method for Multi-cycle BIST

Wang, Senling, Sato, Yasuo, Miyase, Kohei, Kajihara, Seiji

Year:

2012

Language:

english

File:

PDF, 724 KB

english, 2012

6

[IEEE 2011 International Symposium on Low Power Electronics and Design (ISLPED) - Fukuoka, Japan (2011.08.1-2011.08.3)] IEEE/ACM International Symposium on Low Power Electronics and Design - SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures

Kochte, Michael A., Miyase, Kohei, Wen, Xiaoqing, Kajihara, Seiji, Yamato, Yuta, Enokimoto, Kazunan, Wunderlich, Hans-Joachim

Year:

2011

Language:

english

File:

PDF, 420 KB

english, 2011

7

[IEEE 2009 15th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC) - Shanghai, China (2009.11.16-2009.11.18)] 2009 15th IEEE Pacific Rim International Symposium on Dependable Computing - A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing

Yamato, Yuta, Wen, Xiaoqing, Miyase, Kohei, Furukawa, Hiroshi, Kajihara, Seiji

Year:

2009

Language:

english

File:

PDF, 192 KB

english, 2009

8

[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - A novel scan segmentation design method for avoiding shift timing failure in scan testing

Yamato, Yuta, Wen, Xiaoqing, Kochte, Michael A., Miyase, Kohei, Kajihara, Seiji, Wang, Laung-Terng

Year:

2011

Language:

english

File:

PDF, 1.08 MB

english, 2011

9

[IEEE 2006 International Conference on Computer Design - San Jose, CA, USA (2007.10.1-2007.10.4)] 2006 International Conference on Computer Design - A Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation

Wen, Xiaoqing, Miyase, Kohei, Suzuki, Tatsuya, Yamato, Yuta, Kajihara, Seiji, Wang, Laung-Terng, Saluja, Kewal K.

Year:

2006

Language:

english

File:

PDF, 452 KB

english, 2006

10

[IEEE 2008 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2008.11.10-2008.11.13)] 2008 IEEE/ACM International Conference on Computer-Aided Design - Effective IR-drop reduction in at-speed scan testing using distribution-controlling X-Identification

Miyase, Kohei, Kenji Noda,, Hideaki Ito,, Kazumi Hatayama,, Takashi Aikyo,, Yuta Yamato,, Hiroshi Furukawa,, Xiaoqing Wen,, Seiji Kajihara,

Year:

2008

Language:

english

File:

PDF, 844 KB

english, 2008

11

[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Efficient BDD-based Fault Simulation in Presence of Unknown Values

Kochte, Michael A., Kundu, Sandip, Miyase, Kohei, Wen, Xiaoqing, Wunderlich, Hans-Joachim

Year:

2011

Language:

english

File:

PDF, 196 KB

english, 2011

12

[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - On estimation of NBTI-Induced delay degradation

Noda, Mitsumasa, Kajihara, Seiji, Sato, Yasuo, Miyase, Kohei, Wen, Xiaoqing, Miura, Yukiya

Year:

2010

Language:

english

File:

PDF, 282 KB

english, 2010

13

[IEEE 2008 11th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) - Bratislava, Slovakia (2008.04.16-2008.04.18)] 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems - Diagnosis of Realistic Defects Based on the X-Fault Model

Polian, Ilia, Nakamura, Yusuke, Engelke, Piet, Spinner, Stefan, Miyase, Kohei, Kajihara, Seiji, Becker, Bernd, Wen, Xiaoqing

Year:

2008

Language:

english

File:

PDF, 470 KB

english, 2008

14

[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits

Miyase, Kohei, Aso, Masao, Ootsuka, Ryou, Wen, Xiaoqing, Furukawa, Hiroshi, Yamato, Yuta, Enokimoto, Kazunari, Kajihara, Seiji

Year:

2012

Language:

english

File:

PDF, 1.32 MB

english, 2012

15

[IEEE 2013 22nd Asian Test Symposium (ATS) - Yilan County, Taiwan (2013.11.18-2013.11.21)] 2013 22nd Asian Test Symposium - Search Space Reduction for Low-Power Test Generation

Miyase, Kohei, Sauer, Matthias, Becker, Berund, Wen, Xiaoqing, Kajihara, Seiji

Year:

2013

Language:

english

File:

PDF, 381 KB

english, 2013

16

[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - A novel scheme to reduce power supply noise for high-quality at-speed scan testing

Xiaoqing Wen,, Kohei Miyase,, Seiji Kajihara,, Tatsuya Suzuki,, Yuta Yamato,, Girard, Patrick, Yuji Ohsumi,, Laung-Terng Wang,

Year:

2007

Language:

english

File:

PDF, 415 KB

english, 2007

17

On test data volume reduction for multiple scan chain designs

Reddy, Sudhakar M., Miyase, Kohei, Kajihara, Seiji, Pomeranz, Irith

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2003

Language:

english

File:

PDF, 101 KB

english, 2003

18

[IEEE 2009 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2009.04.28-2009.04.30)] 2009 International Symposium on VLSI Design, Automation and Test - On calculation of delay range in fault simulation for test cubes

Kajihara, Seiji, Oku, Shinji, Miyase, Kohei, Wen, Xiaoqing, Sato, Yasuo

Year:

2009

Language:

english

File:

PDF, 239 KB

english, 2009

19

LCTI–SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing

Yamato, Yuta, Miyase, Kohei, Kajihara, Seiji, Xiaoqing Wen,, Laung-Terng Wang,, Kochte, Michael A.

Journal:

IEEE Design and Test

Year:

2013

Language:

english

File:

PDF, 907 KB

english, 2013

20

[IEEE 2013 26th International Conference on VLSI Design: concurrently with the 12th International Conference on Embedded Systems - Pune, India (2013.01.5-2013.01.10)] 2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems - On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression

Enokimoto, Kazunari, Wen, Xiaoqing, Miyase, Kohei, Huang, Jiun-Lang, Kajihara, Seiji, Wang, Laung-Terng

Year:

2013

Language:

english

File:

PDF, 319 KB

english, 2013

21

[IEEE 2010 10th International Symposium on Communications and Information Technologies (ISCIT) - Tokyo, Japan (2010.10.26-2010.10.29)] 2010 10th International Symposium on Communications and Information Technologies - On test pattern compaction with multi-cycle and multi-observation scan test

Kajihara, Seiji, Matsuzono, Makoto, Yamaguchi, Hisato, Sato, Yasuo, Miyase, Kohei, Wen, Xiaoqing

Year:

2010

Language:

english

File:

PDF, 100 KB

english, 2010

22

[ECS ISTC/CSTIC 2009 (CISTC) - Shanghai, China (March 19 - March 20, 2009)] ECS Transactions - Power-aware Test Generation for Reducing Yield Loss Risk in At-Speed Scan Testing

Yamato, Yuta, Wen, Xiaoqing, Miyase, Kohei, Furukawa, Hiroshi, Kajihara, Seiji

Year:

2009

Language:

english

File:

PDF, 529 KB

english, 2009

23

[ACM Press the 44th annual conference - San Diego, California (2007.06.04-2007.06.08)] Proceedings of the 44th annual conference on Design automation - DAC '07 - Critical-path-aware X -filling for effective IR-drop reduction in at-speed scan testing

Wen, Xiaoqing, Miyase, Kohei, Suzuki, Tatsuya, Kajihara, Seiji, Ohsumi, Yuji, Saluja, Kewal K.

Year:

2007

Language:

english

File:

PDF, 371 KB

english, 2007

24

[IEEE 2015 20th IEEE European Test Symposium (ETS) - Cluj-Napoca, Romania (2015.5.25-2015.5.29)] 2015 20th IEEE European Test Symposium (ETS) - Identification of high power consuming areas with gate type and logic level information

Miyase, Kohei, Sauer, Matthias, Becker, Bernd, Wen, Xiaoqing, Kajihara, Seiji

Year:

2015

Language:

english

File:

PDF, 564 KB

english, 2015

25

[IEEE 2015 20th IEEE European Test Symposium (ETS) - Cluj-Napoca, Romania (2015.5.25-2015.5.29)] 2015 20th IEEE European Test Symposium (ETS) - A soft-error tolerant TCAM using partial don't-care keys

Syafalni, Infall, Sasao, Tsutomu, Wen, Xiaoqing, Holst, Stefan, Miyase, Kohei

Year:

2015

Language:

english

File:

PDF, 646 KB

english, 2015

26

[IEEE 2014 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) - Ishigaki, Japan (2014.11.17-2014.11.20)] 2014 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) - Soft-error tolerant TCAMs for high-reliability packet classifications

Syafalni, Infall, Sasao, Tsutomu, Wen, Xiaoqing, Holst, Stefan, Miyase, Kohei

Year:

2014

Language:

english

File:

PDF, 385 KB

english, 2014

27

[IEEE 2016 IEEE European Test Symposium (ETS) - Amsterdam, Netherlands (2016.5.23-2016.5.27)] 2016 21th IEEE European Test Symposium (ETS) - SAT-based post-processing for regional capture power reduction in at-speed scan test generation

Eggersgluss, Stephan, Miyase, Kohei, Wen, Xiaoqing

Year:

2016

Language:

english

File:

PDF, 374 KB

english, 2016

28

On Delay Test Quality for Test Cubes

Oku, Shinji, Kajihara, Seiji, Sato, Yasuo, Miyase, Kohei, Wen, Xiaoqing

Journal:

IPSJ Transactions on System LSI Design Methodology

Year:

2010

Language:

english

File:

PDF, 698 KB

english, 2010

29

High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme

MIYASE, Kohei, WEN, Xiaoqing, FURUKAWA, Hiroshi, YAMATO, Yuta, KAJIHARA, Seiji, GIRARD, Patrick, WANG, Laung-Terng, TEHRANIPOOR, Mohammad

Journal:

IEICE Transactions on Information and Systems

Year:

2010

Language:

english

File:

PDF, 1.73 MB

english, 2010

30

Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing

MIYASE, Kohei, NODA, Kenji, ITO, Hideaki, HATAYAMA, Kazumi, AIKYO, Takashi, YAMATO, Yuta, FURUKAWA, Hiroshi, WEN, Xiaoqing, KAJIHARA, Seiji

Journal:

IEICE Transactions on Information and Systems

Year:

2011

Language:

english

File:

PDF, 2.58 MB

english, 2011

31

[IEEE 2007 44th ACM/IEEE Design Automation Conference - San Diego, CA, USA (2007.06.4-2007.06.8)] 2007 44th ACM/IEEE Design Automation Conference - Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing

Wen, Xiaoqing, Miyase, Kohei, Suzuki, Tatsuya, Kajihara, Seiji, Ohsumi, Yuji, Saluja, Kewal K.

Year:

2007

Language:

english

File:

PDF, 479 KB

english, 2007

32

[IEEE 2016 IEEE 25th Asian Test Symposium (ATS) - Hiroshima, Japan (2016.11.21-2016.11.24)] 2016 IEEE 25th Asian Test Symposium (ATS) - On Optimal Power-Aware Path Sensitization

Sauer, Matthias, Jiang, Jie, Reimer, Sven, Miyase, Kohei, Wen, Xiaoqing, Becker, Bernd, Polian, Ilia

Year:

2016

Language:

english

File:

PDF, 194 KB

english, 2016

33

[ACM Press the 2009 International Conference - San Jose, California (2009.11.02-2009.11.05)] Proceedings of the 2009 International Conference on Computer-Aided Design - ICCAD '09 - A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment

Miyase, Kohei, Yamato, Yuta, Noda, Kenji, Ito, Hideaki, Hatayama, Kazumi, Aikyo, Takashi, Wen, Xiaoqing, Kajihara, Seiji

Year:

2009

Language:

english

File:

PDF, 575 KB

english, 2009

34

A Study of Capture-Safe Test Generation Flow for At-Speed Testing

MIYASE, Kohei, WEN, Xiaoqing, KAJIHARA, Seiji, YAMATO, Yuta, TAKASHIMA, Atsushi, FURUKAWA, Hiroshi, NODA, Kenji, ITO, Hideaki, HATAYAMA, Kazumi, AIKYO, Takashi, SALUJA, Kewal K.

Journal:

IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences

Year:

2010

Language:

english

File:

PDF, 3.55 MB

english, 2010

35

[IEEE 2017 IEEE 26th Asian Test Symposium (ATS) - Taipei City, Taiwan (2017.11.27-2017.11.30)] 2017 IEEE 26th Asian Test Symposium (ATS) - Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption

Zhang, Yucong, Holst, Stefan, Wen, Xiaoqing, Miyase, Kohei, Kajihara, Seiji, Qian, Jun

Year:

2017

Language:

english

File:

PDF, 669 KB

english, 2017

36

[IEEE 2017 IEEE International Test Conference (ITC) - Fort Worth, TX (2017.10.31-2017.11.2)] 2017 IEEE International Test Conference (ITC) - Analysis and mitigation or IR-Drop induced scan shift-errors

Holst, Stefan, Schneider, Eric, Kawagoe, Koshi, Kochte, Michael A., Miyase, Kohei, Wunderlich, Hans-Joachim, Kajihara, Seiji, Wen, Xiaoqing

Year:

2017

Language:

english

File:

PDF, 268 KB

english, 2017

37

Scan-Out Power Reduction for Logic BIST

WANG, Senling, SATO, Yasuo, KAJIHARA, Seiji, MIYASE, Kohei

Journal:

IEICE Transactions on Information and Systems

Year:

2013

Language:

english

File:

PDF, 2.17 MB

english, 2013

38

A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing

YAMATO, Yuta, WEN, Xiaoqing, MIYASE, Kohei, FURUKAWA, Hiroshi, KAJIHARA, Seiji

Journal:

IEICE Transactions on Information and Systems

Year:

2011

Language:

english

File:

PDF, 1.11 MB

english, 2011

39

A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing

MIYASE, Kohei, SAKAI, Ryota, WEN, Xiaoqing, ASO, Masao, FURUKAWA, Hiroshi, YAMATO, Yuta, KAJIHARA, Seiji

Journal:

IEICE Transactions on Information and Systems

Year:

2013

Language:

english

File:

PDF, 1.61 MB

english, 2013

40

On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST

TOMITA, Akihiro, WEN, Xiaoqing, SATO, Yasuo, KAJIHARA, Seiji, MIYASE, Kohei, HOLST, Stefan, GIRARD, Patrick, TEHRANIPOOR, Mohammad, WANG, Laung-Terng

Journal:

IEICE Transactions on Information and Systems

Year:

2014

Language:

english

File:

PDF, 3.48 MB

english, 2014

41

[IEEE 2018 IEEE 27th Asian Test Symposium (ATS) - Hefei, China (2018.10.15-2018.10.18)] 2018 IEEE 27th Asian Test Symposium (ATS) - Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing

Zhang, Yucong, Wen, Xiaoqin, Holst, Stefan, Miyase, Kohei, Kajihara, Seiji, Wunderlich, Hans-Joachim, Qian, Jun

Year:

2018

Language:

english

File:

PDF, 504 KB

english, 2018

42

Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation

LI, Fuqiang, WEN, Xiaoqing, MIYASE, Kohei, HOLST, Stefan, KAJIHARA, Seiji

Journal:

IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences

Year:

2016

File:

PDF, 1.92 MB

2016

43

Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation

LI, Fuqiang, WEN, Xiaoqing, MIYASE, Kohei, HOLST, Stefan, KAJIHARA, Seiji

Journal:

IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences

Year:

2016

Language:

english

File:

PDF, 1.92 MB

english, 2016

44

[IEEE 2018 IEEE 27th Asian Test Symposium (ATS) - Hefei, China (2018.10.15-2018.10.18)] 2018 IEEE 27th Asian Test Symposium (ATS) - Progressive ECC Techniques for Phase Change Memory

Lu, Shyue-Kung, Li, Hui-Ping, Miyase, Kohei

Year:

2018

Language:

english

File:

PDF, 442 KB

english, 2018

45

[IEEE 2019 IEEE International Test Conference in Asia (ITC-Asia) - Tokyo, Japan (2019.9.3-2019.9.5)] 2019 IEEE International Test Conference in Asia (ITC-Asia) - A Static Method for Analyzing Hotspot Distribution on the LSI

Miyase, Kohei, Kawano, Yudai, Lu, Shyue-Kung, Wen, Xiaoqing, Kajihara, Seiji

Year:

2019

File:

PDF, 424 KB

2019

46

[IEEE 2020 IEEE International Conference on Consumer Electronics (ICCE) - Las Vegas, NV, USA (2020.1.4-2020.1.6)] 2020 IEEE International Conference on Consumer Electronics (ICCE) - Analyzing Running Form with Acceleration Sensor

Koga, Chihiro, Miyase, Kohei, Tokui, Masato

Year:

2020

File:

PDF, 1.47 MB

2020

47

Associations between the psoas major muscle index and the presence and severity of coronary artery disease

Imaizumi, Tomoki, Shiga, Yuhei, Idemoto, Yoshiaki, Tashiro, Kohei, Ueda, Yoko, Yano, Yuiko-Miyase, Norimatsu, Kenji, Nakamura, Ayumi, Kuwano, Takashi, Iwata, Atsushi, Miura, Shin-Ichiro

Journal:

Medicine (Williams & Wilkins)

Year:

2020

File:

PDF, 552 KB

2020

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